Electronic Design

Semiconductor Test: Real-time adaptive test algorithm can safely reduce wafer testing time and cost

The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...

Rohde & Schwarz Joins FormFactor’s MeasureOne Partner Program, Advancing Their Partnership in On-Wafer RF Component Characterization

(NASDAQ: FORM), a leading provider of RF probe stations and probe cards, and Rohde & Schwarz, a global leader in test and measurement, today announced a strategic co-marketing partnership as part of ...
Nasdaq

Teradyne Announces Production System for Double-Sided Wafer Probe Test for Silicon Photonics

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...
Seeking Alpha

Aehr Receives Volume Production Order for WaferPak Full Wafer Contactors from Major Silicon Carbide Semiconductor Customer for Test and Burn-in of Silicon Carbide Semiconductor ...

FREMONT, Calif., March 21, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has received an ...